O*NET Resource Center - O*NET Interest Profiler: Reliability, Validity, and Self-Scoring

O*NET® Reports and Documents

Title	*ONET Interest Profiler: Reliability, Validity, and Self-Scoring**
Authors	James Rounds, Cindy M. Walker, Susan X. Day, Lawrence Hubert University of Illinois at Urbana-Champaign Phil Lewis, David Rivkin National Center for ONET Development*
Date	1999
Summary	This report summarizes a study designed to further the development of the ONET Interest Profiler. The purpose of the study was to examine the psychometric properties — reliability and validity — of the final form of the ONET Interest Profiler, and to evaluate the self-scoring aspect of the instrument.
Download	O*NET Interest Profiler: Reliability, Validity, and Self-Scoring (PDF - 915 KB)