O*NET Interest Profiler: Reliability, Validity, and Self-Scoring

1999

James Rounds, Cindy M. Walker, Susan X. Day, Lawrence Hubert
University of Illinois at Urbana-Champaign

Phil Lewis, David Rivkin
National Center for O*NET Development

This report summarizes a study designed to further the development of the O*NET Interest Profiler. The purpose of the study was to examine the psychometric properties — reliability and validity — of the final form of the O*NET Interest Profiler, and to evaluate the self-scoring aspect of the instrument.

• O*NET Interest Profiler: Reliability, Validity, and Self-Scoring (PDF)
• All Interest Profiler Desktop materials (ZIP)
• All Interest Profiler Print Shop materials (ZIP)